Future ATE for System on a Chip... Some Perspectives

Flexibility – Tester FOR the Chip: If you can’t measure it, you can’t improve it. And, the measurement challenges are getting harder and diverging between characterization/production, wafer/final, digital/mixed signal. Yet, the real world ATE solution must address this entire measurement envelope, on as few platforms as possible. ATE solutions must provide inter-platform correlation (e.g. different configurations) to enable leverage and investment protection while maintaining consistent software environment for unified program development. ‘Infinite’ applications, one interface. One platform, ‘infinite’ measurement capabilities.